{"id":3387,"date":"2019-09-18T23:02:20","date_gmt":"2019-09-18T21:02:20","guid":{"rendered":"https:\/\/tazgmbh.de\/?page_id=3387"},"modified":"2022-09-07T23:46:50","modified_gmt":"2022-09-07T21:46:50","slug":"gdoes-glow-discharge-spectrometry","status":"publish","type":"page","link":"https:\/\/tazgmbh.de\/en\/services\/gdoes-glow-discharge-spectrometry\/","title":{"rendered":"GDOES – Glow discharge optical emission spectrometry"},"content":{"rendered":"

GDOES<\/h1>\n<\/div>

The glow discharge spectrometry GDOES offers the possibility to analyze both the layer thickness and the composition.<\/h2>\n

Quantitative GDOES depth profile analyzes offer the possibility of analyzing layers with a thickness of a few atomic layers up to a depth of 500 \u00b5m and more through concentration depth profile courses. Due to our very good equipment (we have 2 new glow discharge spectrometers GDA750 HR from Spectruma Analytik GmbH) and our more than 25 years of experience, we analyze your layers quickly and reliably.<\/p>\n

We differed from our competitors in the depth profile analysis of your samples as follows:<\/p>\n

    \n
  1. Every layer or every sample is analyzed by us with ideal excitation conditions and optimized analysis gases.<\/li>\n
  2. We can analyze the smallest samples using pulsed high-frequency analysis with a lateral resolution of up to 0.8 mm.<\/li>\n
  3. We always analyze the thinnest \/ most complex layers to be analyzed in parallel using REM\/EDX or XRF to ensure a complete and correct analysis.<\/li>\n
  4. Quantitative GDOES depth profile analyzes are part of our accreditation according to DIN EN ISO 17025.<\/li>\n
  5. On request, we can determine the measurement uncertainty of our results according to currently valid standards (GUM, EURCHEM).<\/li>\n
  6. All glow discharge spectrometers and spark spectrometers are checked annually with a calibration certificate.<\/li>\n
  7. We can distinguish organic from inorganic carbon on the sample surface.<\/li>\n
  8. Through pulsed high-frequency analysis, we achieve very good depth resolution, even with thermally unstable layers\/substrates.<\/li>\n
  9. We can perform a stoichiometrically correct determination of oxide layers.<\/li>\n
  10. With us, an H determination is possible with “only minor” artefacts in your layers.<\/li>\n<\/ol>\n<\/div><\/div>