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This seminar provides you with an insight into the performance and possible applications of modern scanning electron microscopy (SEM). Among other things, the basics, types of contrast, preparation and microscopy techniques are presented. With the help of many practical exercises, the seminar participants will be able to independently generate an image on the SEM, carry out and evaluate EDX measurements.

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Speaker:

Thomas Asam

 

Registration deadline:

2 weeks before the scheduled date

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    Measurement uncertainty in spark spectrometry 06.-07.11.2024Introduction to scanning electron microscopy 12.11.2024Fracture assessment on the SEM 13.-14.11.2024

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